Misfit dislocation injection, interfacial stability and photonic properties of Si-Ge strained layers
D. C. Houghton, J.-M. Baribeau, N. L. RowellVolume:
6
Language:
english
Pages:
12
DOI:
10.1007/bf00125882
Date:
October, 1995
File:
PDF, 1.77 MB
english, 1995