Multiple domain feature mapping: a methodology based on...

Journal of Intelligent Manufacturing 1995 / 08 Vol. 6; Iss. 4

Multiple domain feature mapping: a methodology based on deep models of features

S. S. Lim, Lennie E. N. Lim, Ivan B. H. Lee, Bryan K. A. Ngoi
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Volume:
6
Language:
english
Pages:
18
DOI:
10.1007/bf00128648
Date:
August, 1995
File:
PDF, 1.70 MB
english, 1995
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