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Study of deep levels in Schottky/CuInSe2single-crystal devices by deep-level transient spectroscopy measurements
A. M. Bakry, A. M. ElnaggarVolume:
7
Language:
english
Pages:
2
DOI:
10.1007/bf00133114
Date:
June, 1996
File:
PDF, 152 KB
english, 1996