Dynamic characterization of Built-In Current Sensors based...

Journal of Electronic Testing 1996 / 12 Vol. 9; Iss. 3

Dynamic characterization of Built-In Current Sensors based on PN junctions: Analysis and experiments

Josep Rius, Joan Figueras
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Volume:
9
Language:
english
Pages:
16
DOI:
10.1007/bf00134693
Date:
December, 1996
File:
PDF, 1.36 MB
english, 1996
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