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Probe current determination in analytical TEM/STEM and its application to the characterization of large area EDS detectors
Mitchell, David R.G., Nancarrow, Mitchell J.B.Volume:
78
Language:
english
Journal:
Microscopy Research and Technique
DOI:
10.1002/jemt.22551
Date:
October, 2015
File:
PDF, 331 KB
english, 2015