On the different origins of electrical parameter...

physica status solidi (a) 2016 / 06 Vol. 213; Iss. 6

On the different origins of electrical parameter degradation in reverse-bias stressed AlGaN/GaN HEMTs

Ghosh, Saptarsi, Dinara, Syed M., Mahata, Mihir, Das, Subhashis, Mukhopadhyay, Partha, Jana, Sanjay Kumar, Biswas, Dhrubes
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Volume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201532916
Date:
June, 2016
File:
PDF, 1.36 MB
english, 2016
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