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On the different origins of electrical parameter degradation in reverse-bias stressed AlGaN/GaN HEMTs
Ghosh, Saptarsi, Dinara, Syed M., Mahata, Mihir, Das, Subhashis, Mukhopadhyay, Partha, Jana, Sanjay Kumar, Biswas, DhrubesVolume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201532916
Date:
June, 2016
File:
PDF, 1.36 MB
english, 2016