Effects of etching depth for n-contact and current...

Effects of etching depth for n-contact and current spreading layer in InGaN/GaN light emitting diodes

Shim, H W, Kim, Y K, Suh, E-K, Lee, H J
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Volume:
19
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/19/6/021
Date:
June, 2004
File:
PDF, 123 KB
english, 2004
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