Analysis of functional failure mode of commercial deep...

Chinese Physics B 2015 / 10 Vol. 24; Iss. 10

Analysis of functional failure mode of commercial deep sub-micron SRAM induced by total dose irradiation

Zheng, Qi-Wen, Cui, Jiang-Wei, Zhou, Hang, Yu, De-Zhao, Yu, Xue-Feng, Lu, Wu, Guo, Qi, Ren, Di-Yuan
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Volume:
24
Language:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/24/10/106106
Date:
October, 2015
File:
PDF, 315 KB
english, 2015
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