Study on the low leakage current of an MIS structure...

Study on the low leakage current of an MIS structure fabricated by ICP-CVD

Tsai, S-Y, Lu, Y-M, Hon, M-H
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Volume:
100
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/100/4/042030
Date:
March, 2008
File:
PDF, 590 KB
english, 2008
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