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Effect of pipeline thickness on electrical capacitance tomography
Daoye, Yang, Bin, Zhou, Chuanlong, Xu, Guanghua, Tang, Shimin, WangVolume:
147
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/147/1/012030
Date:
February, 2009
File:
PDF, 1.03 MB
english, 2009