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Causes of the ESD immunity testing problems in the IEC 61000-4-2 standard
Yuan, Qingyun, Liu, Shanghe, Sun, Yongwei, Zhang, XijunVolume:
418
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/418/1/012049
Date:
March, 2013
File:
PDF, 629 KB
english, 2013