Recrystallization behaviour and electrical properties of...

Recrystallization behaviour and electrical properties of germanium ion implanted polycrystalline silicon films

Myeon-Koo Kang, Takayuki Matsui, Hiroshi Kuwano
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Volume:
7
Language:
english
Pages:
4
DOI:
10.1007/bf00180785
Date:
December, 1996
File:
PDF, 574 KB
english, 1996
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