[IEEE 2015 3rd IAPR Asian Conference on Pattern Recognition...

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[IEEE 2015 3rd IAPR Asian Conference on Pattern Recognition (ACPR) - Kuala Lumpur, Malaysia (2015.11.3-2015.11.6)] 2015 3rd IAPR Asian Conference on Pattern Recognition (ACPR) - Local feature reliability measure using multiview synthetic images for mobile visual search

Matsuzaki, Kohei, Uchida, Yusuke, Sakazawa, Shigeyuki, Satoh, Shin'ichi
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Year:
2015
Language:
english
DOI:
10.1109/acpr.2015.7486485
File:
PDF, 523 KB
english, 2015
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