[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou,...

  • Main
  • [IEEE 2014 IEEE 23rd Asian Test...

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - On the Use of Scan Chain to Improve Physical Attacks (Extended Abstract)

Fan, Junfeng, Xie, Hua, Zhang, Yiwei
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2014
Language:
english
DOI:
10.1109/ats.2014.71
File:
PDF, 187 KB
english, 2014
Conversion to is in progress
Conversion to is failed