[IEEE 2009 IEEE International Geoscience and Remote Sensing Symposium - Cape Town, South Africa (2009.07.12-2009.07.17)] 2009 IEEE International Geoscience and Remote Sensing Symposium - Modeling the effect of surface roughness on the back-scattering coefficient and emissivity of a soil-litter medium using a numerical model
Lawrence, H., Demontoux, F., Wigneron, J.-P., Kerr, Y., Wu, T.-D., Borderies, P., Paillou, P., Chen, L., Shi, J.-C.Year:
2009
Language:
english
DOI:
10.1109/igarss.2009.5417805
File:
PDF, 248 KB
english, 2009