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IR Camera Validation of IGBT Junction Temperature Measurement via Peak Gate Current
Baker, Nick, Dupont, Laurent, Munk-Nielsen, Stig, Iannuzzo, Francesco, Liserre, MarcoYear:
2016
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/tpel.2016.2573761
File:
PDF, 1.36 MB
english, 2016