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Combining gradient ascent search and support vector machines for effective autofocus of a field emission-scanning electron microscope
DEMBÉLÉ, S., LEHMANN, O., MEDJAHER, K., MARTURI, N., PIAT, N.Language:
english
Journal:
Journal of Microscopy
DOI:
10.1111/jmi.12419
Date:
May, 2016
File:
PDF, 994 KB
english, 2016