SPIE Proceedings [SPIE SPIE/IS&T 1992 Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 9 February 1992)] Machine Vision Applications in Character Recognition and Industrial Inspection - Contextual analysis of machine-printed addresses
Cullen, Peter B., Ho, Tin K., Hull, Jonathan J., Prussak, Michal, Srihari, Sargur N., D'Amato, Donald P., Blanz, Wolf-Ekkehard, Dom, Byron E., Srihari, Sargur N.Volume:
1661
Year:
1992
Language:
english
DOI:
10.1117/12.130293
File:
PDF, 518 KB
english, 1992