SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Instrumentation systems for passive fiber optic chemical sensors
Ferrell, Douglas J., Lerner, Jeremy M., Lieberman, Robert A., Quintana, Toni B., Schmidlin, Edward M., Syracuse, Steven J., Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., ReVolume:
1681
Year:
1992
Language:
english
DOI:
10.1117/12.137724
File:
PDF, 484 KB
english, 1992