SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Remote Raman analysis for process-monitoring applications
Purcell, Francis J., Grayzel, Roy E., Adar, Fran, Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., Rein, Alan J., Sohl, Cary, Todd, Terry R., Weyer, LoisVolume:
1681
Year:
1992
Language:
english
DOI:
10.1117/12.137731
File:
PDF, 852 KB
english, 1992