SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Charge-Coupled Devices and Solid State Optical Sensors III - Thinned back-illuminated CCD for x-ray microscopy
Meyer-Ilse, Werner, Wilhein, Thomas, Guttmann, Peter, Blouke, Morley M.Volume:
1900
Year:
1993
Language:
english
DOI:
10.1117/12.148602
File:
PDF, 190 KB
english, 1993