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SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] Multilayer and Grazing Incidence X-Ray/EUV Optics II - Engineering qualification model of the SAX x-ray mirror unit: technical data and x-ray imaging characteristics
Conti, Giancarlo, Mattaini, E., Santambrogio, E., Sacco, Bruno, Cusumano, Giancarlo, Citterio, Oberto, Braeuninger, Heinrich W., Burkert, Wolfgang, Hoover, Richard B.Volume:
2011
Year:
1994
Language:
english
DOI:
10.1117/12.167245
File:
PDF, 583 KB
english, 1994