SPIE Proceedings [SPIE SPIE's 1993 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 11 July 1993)] X-Ray and Ultraviolet Polarimetry - Design of precise ultraviolet imaging polarimeters that rely on in-situ calibration
November, Laurence J., Fineschi, SilvanoVolume:
2010
Year:
1994
Language:
english
DOI:
10.1117/12.168580
File:
PDF, 907 KB
english, 1994