SPIE Proceedings [SPIE Optical 3D Measurement Techniques II: Applications in Inspection, Quality Control, and Robotics - Zurich, Switzerland (Monday 4 October 1993)] Optical 3D Measurement Techniques II: Applications in Inspection, Quality Control, and Robotics - Fast digital survey of historical sites and monuments by using the 4D LaserScanner system
Kleiner, T., Wehr, Aloysius, Gruen, Armin, Kahmen, HeribertVolume:
2252
Year:
1994
Language:
english
DOI:
10.1117/12.169851
File:
PDF, 402 KB
english, 1994