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SPIE Proceedings [SPIE OE/LASE '94 - Los Angeles, CA (Sunday 23 January 1994)] Laser Diode Technology and Applications VI - Wafer scale testing of vertical cavity surface-emitting laser arrays
Dziura, Thaddeus G., Wang, S. C., Chen, Pei C., Johnson, Lawrence A., Temkin, HenrykVolume:
2148
Year:
1994
Language:
english
DOI:
10.1117/12.176642
File:
PDF, 364 KB
english, 1994