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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing - Orlando, FL (Monday 4 April 1994)] Characterization and Propagation of Sources and Backgrounds - Understanding infrared clutter through fixation point analysis
Rotman, Stanley R., Kowalczyk, Marta L., Cartier, Joan F., Chang, J., Watkins, Wendell R., Clement, DieterVolume:
2223
Year:
1994
Language:
english
DOI:
10.1117/12.177907
File:
PDF, 1.34 MB
english, 1994