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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Engineering and Photonics in Aerospace Sensing - Orlando, FL (Monday 4 April 1994)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing V - Understanding infrared clutter through fixation point analysis
Rotman, Stanley R., Kowalczyk, Marta L., Cartier, Joan F., Chang, J., Holst, Gerald C.Volume:
2224
Year:
1994
Language:
english
DOI:
10.1117/12.180084
File:
PDF, 855 KB
english, 1994