SPIE Proceedings [SPIE Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics: International Workshop - Kiev, Ukraine (Thursday 6 May 1993)] Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics - Luminescence diagnostics of direct-gap semiconductors within a wide range of excitation levels
Shevel, Serhiy G., Taranenko, L. V., Voznyi, Vladimir L., Svechnikov, Sergei V., Valakh, Mikhail Y.Volume:
2113
Year:
1994
Language:
english
DOI:
10.1117/12.191973
File:
PDF, 271 KB
english, 1994