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SPIE Proceedings [SPIE Fifth International Conference on Machine Vision (ICMV 12) - Wuhan, China (Saturday 20 October 2012)] Fifth International Conference on Machine Vision (ICMV 2012): Algorithms, Pattern Recognition, and Basic Technologies - Design and realization of assessment software for DC-bias of transformers
Liu, Chang, Liu, Lian-guang, Yuan, Zhong-chen, Wang, Yulin, Tan, Liansheng, Zhou, JianhongVolume:
8784
Year:
2013
Language:
english
DOI:
10.1117/12.2013919
File:
PDF, 223 KB
english, 2013