SPIE Proceedings [SPIE International Symposium on Precision Engineering Measurement and Instrumentation 2012 - Chengdu, China (Wednesday 8 August 2012)] Eighth International Symposium on Precision Engineering Measurement and Instrumentation - A contact probe using Michelson interferometers for CMMs
Huang, Chao-min, Liao, Bo-Hsun, Fan, Kuang-Chao, Lin, JieVolume:
8759
Year:
2013
Language:
english
DOI:
10.1117/12.2016788
File:
PDF, 654 KB
english, 2013