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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology (OIT2013) - Beijing, China (Sunday 17 November 2013)] 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Direct and complete calibration of phase modulation depth of LCOS by using double exposure digital holography
Panezai, Spozmai, Wang, Dayong, Zhao, Jie, Wang, Yunxin, Ma, Sijin, Rong, Lu, Lin, Xinggang, Zheng, JesseVolume:
9045
Year:
2013
Language:
english
DOI:
10.1117/12.2038174
File:
PDF, 532 KB
english, 2013