SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Thursday 9 October 2014)] Optical Metrology and Inspection for Industrial Applications III - System implementation of self-mixing interferometry technique-based measurement on Young's modulus
Han, Sen, Yoshizawa, Toru, Zhang, Song, Lin, Ke, Yu, Yanguang, Liu, Zhenghao, Xi, Jiangtao, Li, Huijun, Liu, CuilingVolume:
9276
Year:
2014
Language:
english
DOI:
10.1117/12.2071360
File:
PDF, 400 KB
english, 2014