SPIE Proceedings [SPIE Smart Structures & Materials '95 - San Diego, CA (Sunday 26 February 1995)] Smart Structures and Materials 1995: Industrial and Commercial Applications of Smart Structures Technologies - Flaw detection in d33-mode ceramic multilayer actuators using impedance-frequency scans
Kahn, Manfred, Krause, Daniel J., Chase, Mark T., Crowe, C. Robert, Anderson, Gary L.Volume:
2447
Year:
1995
Language:
english
DOI:
10.1117/12.209346
File:
PDF, 282 KB
english, 1995