SPIE Proceedings [SPIE SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 9 July 1995)] Near-Field Optics - Refractive index profiling of planar optical waveguides using near-field scanning optical microscopy
Dhar, Lisa, Lee, H. J., Laskowski, E. J., Buratto, Steve K., Narayanan, Chellappan, Presby, Herman M., Bahr, Charles C., Anthony, Phillip J., Cardillo, Mark J., Paesler, Michael A., Moyer, Patrick J.Volume:
2535
Year:
1995
Language:
english
DOI:
10.1117/12.218696
File:
PDF, 253 KB
english, 1995