SPIE Proceedings [SPIE Photonics East '95 - Philadelphia, PA (Sunday 22 October 1995)] Videometrics IV - Geometry measurement as integrated part of the manufacturing process using a moved CCD camera
Zapp, Michael, Janocha, Hartmut, El-Hakim, Sabry F.Volume:
2598
Year:
1995
Language:
english
DOI:
10.1117/12.220916
File:
PDF, 430 KB
english, 1995