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SPIE Proceedings [SPIE SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring - Las Vegas, Nevada, United States (Sunday 20 March 2016)] Industrial and Commercial Applications of Smart Structures Technologies 2016 - Comparison of binary and multi-level logic electronics for embedded systems
Griffin, Steven F., Damti, Shirly M., Watkins, Steve E., Stanley, R. J.Volume:
9801
Year:
2016
Language:
english
DOI:
10.1117/12.2219374
File:
PDF, 786 KB
english, 2016