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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Machine Vision Applications in Industrial Inspection IV - General method for inspection based on artificial vision of plan products with random or organized texture
Alexief, Jean-Louis, Kerkeni, Naceur, Angue, Jean-Claude, Rao, A. Ravishankar, Chang, NingVolume:
2665
Year:
1996
Language:
english
DOI:
10.1117/12.232233
File:
PDF, 1.53 MB
english, 1996