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SPIE Proceedings [SPIE Electronic Imaging: Science & Technology - San Jose, CA (Sunday 28 January 1996)] Liquid Crystal Materials, Devices, and Applications IV - Voltage imaging(TM) for L-contact panel testing
Liu, Ying-Moh, Henley, Francois, Miller, Mike, Salerno, Jack, Shashidhar, RanganathanVolume:
2651
Year:
1996
Language:
english
DOI:
10.1117/12.235345
File:
PDF, 165 KB
english, 1996