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SPIE Proceedings [SPIE International Symposium on Polarization Analysis and Applications to Device Technology - Yokohama, Japan (Wednesday 12 June 1996)] International Symposium on Polarization Analysis and Applications to Device Technology - Spectroscopic ellipsometry and photometry applied to color filter characterization
Defranoux, Christophe, Piel, Jean-Philippe, Stehle, Jean-Louis P., Yoshizawa, Toru, Yokota, HideshiVolume:
2873
Year:
1996
Language:
english
DOI:
10.1117/12.246214
File:
PDF, 112 KB
english, 1996