SPIE Proceedings [SPIE Photonics China '96 - Beijing, China...

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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Solder-paste inspection by structured light methods based on phase measurement

Di Stefano, Luigi, Boland, Frank, Wu, Frederick Y., Ye, Shenghua
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Volume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253007
File:
PDF, 499 KB
english, 1996
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