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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - Advancement of black-spot method for testing veiling glare
Li, Fengchun, Zhang, Guoyu, Gao, Yujin, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253047
File:
PDF, 289 KB
english, 1996