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SPIE Proceedings [SPIE SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 4 August 1996)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII - Spectral responsivity of silicon photodiodes: high-accuracy measurement and improved self-calibration in the soft x-ray spectral range
Scholze, Frank, Rabus, Hans, Ulm, Gerhard, Siegmund, Oswald H. W., Gummin, Mark A.Volume:
2808
Year:
1996
Language:
english
DOI:
10.1117/12.256027
File:
PDF, 371 KB
english, 1996