SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Applications of Digital Image Processing XX - Diagnosing unknown aberrations in an adaptive optics system using phase diversity
Lee, David J., Welsh, Byron M., Roggemann, Michael C., Ellerbroek, Brent L., Tescher, Andrew G.Volume:
3164
Year:
1997
Language:
english
DOI:
10.1117/12.279583
File:
PDF, 288 KB
english, 1997