SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Optical Diagnostic Methods for Inorganic Transmissive Materials - Fourier transform refractometry
Kaplan, Simon G., Hanssen, Leonard M., Griesmann, Ulf, Gupta, Rajeev, Datla, Raju V., Hanssen, Leonard M.Volume:
3425
Year:
1998
Language:
english
DOI:
10.1117/12.326666
File:
PDF, 1.36 MB
english, 1998