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SPIE Proceedings [SPIE 1998 International Conference on Applications of Photonic Technology - Ottawa, Canada (Monday 27 July 1998)] 1998 International Conference on Applications of Photonic Technology III: Closing the Gap between Theory, Development, and Applications - Whole film inspection using extended source
Aiyer, Arun A., Chau, Henry K., Lampropoulos, George A., Lessard, Roger A.Volume:
3491
Year:
1998
Language:
english
DOI:
10.1117/12.328639
File:
PDF, 1.26 MB
english, 1998