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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] X-Ray Microfocusing: Applications and Techniques - New stepped spherical x-ray diffractor for microprobe analysis
Mazuritsky, M. I., Soldatov, Alexander V., Marcelli, Augusto, Latush, Evgeny L., McNulty, IanVolume:
3449
Year:
1998
Language:
english
DOI:
10.1117/12.330334
File:
PDF, 269 KB
english, 1998