SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Three-Dimensional Imaging, Optical Metrology, and Inspection IV - Practical applications of laser holography in metrology for 3D imaging and industrial inspection
Ginzburg, Vera M., Harding, Kevin G., Svetkoff, Donald J., Creath, Katherine, Harris, James S.Volume:
3520
Year:
1998
Language:
english
DOI:
10.1117/12.334347
File:
PDF, 2.91 MB
english, 1998