SPIE Proceedings [SPIE Microelectronic Manufacturing...

  • Main
  • SPIE Proceedings [SPIE Microelectronic...

SPIE Proceedings [SPIE Microelectronic Manufacturing Technologies - Edinburgh, United Kingdom (Wednesday 19 May 1999)] Lithography for Semiconductor Manufacturing - Performance of 193-nm resists based on alicyclic methacrylate and cyclo-olefin systems

Padmanaban, Munirathna, Cook, Michelle M., Durham, Dana L., Khanna, Dinesh N., Klauck-Jacobs, Axel, Oberlander, Joseph E., Rahman, M. D., Dammel, Ralph R., Mack, Chris A., Stevenson, Tom
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3741
Year:
1999
Language:
english
DOI:
10.1117/12.346883
File:
PDF, 2.79 MB
english, 1999
Conversion to is in progress
Conversion to is failed