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SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Yokohama, Japan (Wednesday 16 June 1999)] Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Referenced polarization imaging for surface displacement measurements
Ulibarri, Laura J., Boger, James K., Fetrow, Matthew P., Yamaguchi, IchirouVolume:
3740
Year:
1999
Language:
english
DOI:
10.1117/12.347704
File:
PDF, 1.05 MB
english, 1999