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SPIE Proceedings [SPIE Microelectronic Manufacturing '99 - Santa Clara, CA (Wednesday 22 September 1999)] Microelectronic Device Technology III - Mismatch characterization and modelization of deep-submicron CMOS transistors
Thibieroz, Helene, Duvallet, Alain, Burnett, David, Tsuchiya, ToshiakiVolume:
3881
Year:
1999
Language:
english
DOI:
10.1117/12.360542
File:
PDF, 423 KB
english, 1999