SPIE Proceedings [SPIE Microelectronic Manufacturing '99 -...

  • Main
  • SPIE Proceedings [SPIE Microelectronic...

SPIE Proceedings [SPIE Microelectronic Manufacturing '99 - Santa Clara, CA (Wednesday 22 September 1999)] Microelectronic Device Technology III - Mismatch characterization and modelization of deep-submicron CMOS transistors

Thibieroz, Helene, Duvallet, Alain, Burnett, David, Tsuchiya, Toshiaki
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3881
Year:
1999
Language:
english
DOI:
10.1117/12.360542
File:
PDF, 423 KB
english, 1999
Conversion to is in progress
Conversion to is failed